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EDI CON Online: Getting to the Source: Integrated Circuits (ICs) and Component EMC Testing

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When

10/6/20 3:00 pm to 10/6/20 3:30 pm EST

Event Description

Title: Getting to the Source: Integrated Circuits (ICs) and Component EMC Testing

Date: October 6, 2020

Time: 12:00pm PT / 3:00pm ET

Sponsored by: AR RF/Microwave Instrumentation

Presented by: Dean F. Landers, Applications Engineer

Abstract:
Failures in EMC testing often result in treating the symptoms of the issue rather than attacking the source. If we know the source of the issue rather than chase the symptoms, we will save time, cost, and frustrations. In this discussion, we will attack EMC testing from a component standpoint so that when issues arise, we can pinpoint the solution, saving time, cost, and frustrations.

Presenter Bio:

Dean Landers is an Applications Engineer for Amplifier Research. He is actively engaged in new application and product development, system development and integration, customer support, and training with hardware demonstrations for both customers and AR personnel. Prior to working at Amplifier Research, Dean spent 9 years as an EMC Test Engineer at Retlif Testing Laboratories, managing military, commercial aviation, and commercial test programs, writing customer test procedures, and working with customers to help them understand their compliance needs and requirements. He also serves on the IEEE EMC Society Executive Committee and is the current chair.

Please note:
To register for other EDI CON Online signal integrity, power integrity and EMC/EMI related events, please visit the Microwave Journal website.

By registering, you are agreeing to allow the data collected to be shared with Microwave Journal®, Signal Integrity Journal™, the speakers & the sponsors of this event. You may be contacted regarding the subject matter presented.

 

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