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Using VNAs for Eye Diagrams: Understanding S-parameter Measurements

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When

3/28/17 11:00 am to 3/28/17 12:00 pm EST

Event Description

Signal Integrity Webinar Series

Title: Using VNAs for Eye Diagrams: Understanding S-parameter Measurements

Date: March 28, 2017

Time: 8am PT/ 11am ET

Sponsored by: Passive Plus, Inc. and Anritsu Co.

Presented by: Alfred P. Neves, Founder and Chief Technologist at Wild River and Chun-ting "Tim" Wang Lee, Ph.D candidate

Abstract:

Learn how to create meaningful eye diagrams from S-parameters, including the basics of S-parameters, how an eye diagram is calculated using S-parameters, S-parameter test considerations and measurement examples. Topics include VNA setup, calibration, performance parameters and common S-parameter measurements. The discussion also covers differential S-parameters, how to assess an eye diagram, and how to remedy issues with closed eyes using an EDA toolset.

Presenter Bios:

Alfred P. Neves, Founder and Chief Technologist at Wild River, has 30 years of experience designing and application development of semiconductor products, capitol equipment design focused on jitter and signal integrity analysis, and has successfully been involved with numerous business developments and startup activity for the last 13 years. Al is involved with the Signal Integrity community as a consultant, high-speed system level design manager and engineer. Recent technical accomplishments include development of platforms and methods to improve 3D electromagnetic correspondence to measure-based methods, including advancing time and frequency domain calibration methods.

Al focuses on measure-based model development, package characterization, high-speed board design, low jitter design, analysis, and training. He earned a B.S. in Applied Mathematics at the University of Massachusetts.

Chun-ting "Tim" Wang Lee is currently a Ph.D candidate focusing on signal integrity research in the Electric Engineering Department at the University of Colorado, Boulder. Wang Lee received his BSEE degrees from University of Illinois at Urbana Champaign, and MSEE from University of Colorado at Boulder. In the past few years, he has been involved in studies on signal integrity and projects sponsored by industry-leading companies such as Keysight Technologies and Teledyne LeCroy. Tim is currently working on projects pertinent to PCB material property extraction, jitter analysis, and EDA tools for channel optimization.