Title: Characterizing the VRM
Date: September 12, 2019
Time: 8:00am PT / 11:00am ET
Presented by: Steve Sandler, Founder, Picotest
A high fidelity VRM model is required to properly assess system performance, and this includes power integrity (PI). This has always been my position and I have presented papers, videos and lectures on the topic. Most recently I wrote an article, published in the July 2019 Signal Integrity Journal, illustrating the interactions between the VRM and the system. This clearly shows why full VRM characterization is essential.
In this session I’ll show the test bench setup to perform the measurements needed to characterize the predominant VRM noise paths:
These measurements provide a roadmap to optimizing the VRM from a system level perspective, ensuring power integrity, while minimizing VRM noise that degrades performance of other system circuits.
Steve Sandler has been involved with power system engineering for nearly 40 years. The founder and CEO of Picotest.com, a company specializing in instruments and accessories for high-performance power system and distributed system testing, Steve is also the founder of AEi Systems, a company that specializes in worst-case circuit analysis for high-reliability industries. Steve also serves as a member of Signal Integrity Journal’s editorial advisory board.
To register for any EDI CON Online 5G/IoT or Radar/Antenna events, please visit the Microwave Journal website.
By registering, you are agreeing to allow the data collected to be shared with Microwave Journal®, Signal Integrity Journal™, the speakers & the sponsors of this event. You may be contacted regarding the subject matter presented.