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Impulse Response from Insertion Loss

capn.freako@gmail.com — Tue, 25 Aug 2020 00:00:00 -0400

This article explains how to convert channel insertion loss data in a standard Touchstone file into the channel impulse response for time domain simulations. It also shows how some pre-processing of the Touchstone data can help improve results by eliminating the ringing that results from the use of frequency-limited measurement data. Read on to see how.

Return Loss: A Collision Between Two Worlds

eric@beTheSignal.com — Tue, 28 Apr 2020 00:00:00 -0400

The problem with the original definition of return loss is that we don't measure return loss this way anymore. Eric Bogatin explains what’s changed and why and how to reduce entropy in the universe while he’s at it.

Ensuring High Signal Quality in PCIe Gen3 Channels

Tue, 14 Mar 2017 00:00:00 -0400

The increased data rates of today’s high-speed Input/Output (I/O) buses make maintaining transmission channel signal quality all the more challenging. One reason for the challenge is the parasitic effects that result from bus interconnects. Over the past decade, data rates for electrical interconnects have experienced a dramatic increase—from 1 Gbps to 25 Gbps and beyond—to meet the ever increasing demand for more I/O bandwidth from modern networking applications and high-capacity storage.

Multi-Tone for EMC: Testing, Theory and Practice

Wed, 02 Nov 2016 21:26:00 -0400

Multi-tone testing has many benefits. While the multi-tone methodology was initially implemented to increase the speed of immunity testing, it has been found that this method also improves equipment efficiency, offers greater flexibility to truly test the equipment (EUT) under real world threat conditions, and can be fully compliant to standards.