Signal Integrity Webinar Series

Title:  Measuring Very Low Power Signals

Date:  September 21, 2017

Time:  8am PT/ 11am ET

Presented by:  Arthur (Art) Pini, Independent Consultant

Sponsored by:  Rohde & Schwarz and Signal Microwave

Abstract:

Small Signals are common in many technical disciplines and measuring them accurately requires a range of knowledge.  First the need to determine exactly what is to be measured.  Then the selection of the measuring instrument best fitted to extract the desired data.  Finally, choosing processing and analysis techniques to optimize the measurement.

This webinar is intended to introduce some basic concepts related to the measurement of small signals.  Instrument selection including oscilloscopes, digitizers, spectrum analyzers, and vector signal analyzers will be discussed.  The advantages and limitations of each instrument for particular measurements will be examined.  Additionally, it will cover instrument resolution, dynamic range, noise, and readout issues and how they affect measurement accuracy. The best means of connecting to the signal to minimize interference and instrument loading.  How to choose suitable processing and analysis tools such as averaging, smoothing, filtering, and correlation.  All these concepts will be illustrated with appropriate examples.

Who should attend: Signal integrity engineers and engineering managers interested in optimizing measurements for low-power signals.

Presenter Bio:

Arthur (Art) Pini is an independent consultant working in the area of test and measurement technology.  He has more than fifty years’ experience working with companies including Teledyne LeCroy, Summation, Wavetek Rockland, and Nicolet Scientific.  He has experience in supporting oscilloscopes, modular test systems, digitizers, arbitrary waveform generators, and real-time spectrum analyzers.

He holds a Bachelor’s degree in Electrical Engineering from the City College of New York and a Master of Electrical Engineering from the City University of New York and is the author of multiple articles on measurement technology.