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Couldn’t make it to California? Well, here’s a review of some of the products that were on display on the EDI CON USA show floor at the Santa Clara Convention Center October 17-18. In addition to two full days of technical sessions and programming, the event also included a celebration of innovation in the EDI CON EXPO hall, complete with show-floor networking opportunities and speed training.
Tektronix, Inc. introduces the AFG31000 series. A completely new design, the AFG31000 features many key firsts including the largest touchscreen and new user interface that will delight engineers and researchers who need to generate complex test cases for debugging, troubleshooting, characterizing and validating devices under test.
The new R&S ELEKTRA EMC test software fully automates electromagnetic interference (EMI) tests. It also covers electromagnetic susceptibility (EMS) to address both product development and certification in line with international standards. Making the most of today’s EMC testing instruments, users can now boost testing efficiency in EMC labs.
This note focuses on a particular implementation of Broadband and Multilayer Ceramic Capacitors and how to obtain the best performance when they’re used on various substrates. Download the app note to learn more.
DDR3/4 DRAM Memory is one of the last remaining parallel interfaces in current industry standards. It is expected to stay parallel (as the "dinosaur" of interface definitions) for the next generation of memory. Design and especially verification and debugging of the interface is a difficult task due to several specialties of DDR signaling, which will be covered in this webinar.
In this seminar techniques for analyzing the performance of PAM4 transmitters and receivers will be discussed. After a brief review of the PAM4 scheme, we dive into jitter and noise analysis of three eye diagram PAM4 signals including the key transmitter diagnostic and compliance tests. We then turn to receiver tolerance testing for both diagnostics including techniques for generating stressed PAM4 signals and measuring both the symbol and bit error ratios.
Visit our archived webinars page for educational resources on various design and measurement subjects and view at your convenience. Browse webinars here.
